Spatial Annotation of Time Series for Data Driven Quality Assurance in Additive Manufacturing

Raven T. Reisch, Matteo Pantano, Lucas Janisch, Alois Knoll, Dongheui Lee

Research output: Contribution to journalConference articlepeer-review

Abstract

One of the biggest challenges for artificial intelligence in industry is the lack of labeled application data. Particularly for time series data, labeling requires a large amount of time for data preparation and expert knowledge both in data analysis and in the application domain. In this work, we propose a methodology for labeling time series solving the two barriers identified above in an additive manufacturing use case. Our approach correlates spatial and temporal features of process defects by means of a spatial sensor. By applying our method, we were able to achieve shorter labeling time while obtaining high-quality labels.

Original languageEnglish
Pages (from-to)753-758
Number of pages6
JournalProcedia CIRP
Volume118
DOIs
StatePublished - 2023
Event16th CIRP Conference on Intelligent Computation in Manufacturing Engineering, CIRP ICME 2022 - Naples, Italy
Duration: 13 Jul 202215 Jul 2022

Keywords

  • Direct Energy Deposition
  • Labeling
  • Quality Assurance
  • Spatial Sensors
  • Spatio-Temporal
  • Time Series

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