TY - JOUR
T1 - Solvent-induced morphology in polymer-based systems for organic photovoltaics
AU - Ruderer, Matthias A.
AU - Guo, Shuai
AU - Meier, Robert
AU - Chiang, Hsin Yin
AU - Körstgens, Volker
AU - Wiedersich, Johannes
AU - Perlich, Jan
AU - Roth, Stephan V.
AU - Müller-Buschbaum, Peter
PY - 2011/9/9
Y1 - 2011/9/9
N2 - Studies on the influence of four different solvents on the morphology and photovoltaic performance of bulk-heterojunction films made of poly(3-hexylthiophene) (P3HT) and [6,6]-phenyl-C61 butyric acid methyl ester (PCBM) via spin-coating for photovoltaic applications are reported. Solvent-dependent PCBM cluster formation and P3HT crystallization during thermal annealing are investigated with optical microscopy and grazing-incidence wide-angle X-ray scattering (GIWAXS) and are found to be insufficient to explain the differences in device performance. A combination of atomic force microscopy (AFM), X-ray reflectivity (XRR), and grazing-incidence small-angle X-ray scattering (GISAXS) investigations results in detailed knowledge of the inner film morphology of P3HT:PCBM films. Vertical and lateral phase separation occurs during spin-coating and annealing, depending on the solvent used. The findings are summarized in schematics and compared with the IV characteristics. The main influence on the photovoltaic performance arises from the vertical material composition and the existence of lateral phase separation fitting to the exciton diffusion length. Absorption and photoluminescence measurements complement the structural analysis.
AB - Studies on the influence of four different solvents on the morphology and photovoltaic performance of bulk-heterojunction films made of poly(3-hexylthiophene) (P3HT) and [6,6]-phenyl-C61 butyric acid methyl ester (PCBM) via spin-coating for photovoltaic applications are reported. Solvent-dependent PCBM cluster formation and P3HT crystallization during thermal annealing are investigated with optical microscopy and grazing-incidence wide-angle X-ray scattering (GIWAXS) and are found to be insufficient to explain the differences in device performance. A combination of atomic force microscopy (AFM), X-ray reflectivity (XRR), and grazing-incidence small-angle X-ray scattering (GISAXS) investigations results in detailed knowledge of the inner film morphology of P3HT:PCBM films. Vertical and lateral phase separation occurs during spin-coating and annealing, depending on the solvent used. The findings are summarized in schematics and compared with the IV characteristics. The main influence on the photovoltaic performance arises from the vertical material composition and the existence of lateral phase separation fitting to the exciton diffusion length. Absorption and photoluminescence measurements complement the structural analysis.
KW - X-ray scattering
KW - morphology
KW - organic photovoltaics
KW - polymers
KW - thin films
UR - http://www.scopus.com/inward/record.url?scp=80052422364&partnerID=8YFLogxK
U2 - 10.1002/adfm.201100945
DO - 10.1002/adfm.201100945
M3 - Article
AN - SCOPUS:80052422364
SN - 1616-301X
VL - 21
SP - 3382
EP - 3391
JO - Advanced Functional Materials
JF - Advanced Functional Materials
IS - 17
ER -
