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Soft-landing electrospray ion beam deposition of sensitive oligoynes on surfaces in vacuum

  • Gordon Rinke
  • , Stephan Rauschenbach
  • , Stephen Schrettl
  • , Tobias N. Hoheisel
  • , Jonathan Blohm
  • , Rico Gutzler
  • , Federico Rosei
  • , Holger Frauenrath
  • , Klaus Kern
  • Max Planck Institute for Solid State Research
  • École Polytechnique Fédérale de Lausanne (EPFL)
  • University of Warwick
  • Université du Québec

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

Advances in synthetic chemistry permit the synthesis of large, highly functional, organic molecules. Characterizing the complex structure of such molecules with highly resolving, vacuum-based methods like scanning probe microscopy requires their transfer into the gas phase and further onto an atomically clean surface in ultrahigh vacuum without causing additional contamination. Conventionally this is done via sublimation in vacuum. However, similar to biological molecules, large synthetic compounds can be non-volatile and decompose upon heating. Soft-landing ion beam deposition using soft ionization methods represents an alternative approach to vacuum deposition. Using different oligoyne derivatives of the form of R1 (C≡C)n-R2, here we demonstrate that even sensitive molecules can be handled by soft-landing electrospray ion beam deposition. We generate intact molecular ions as well as fragment ions with intact hexayne parts and deposit them on clean metal surfaces. Scanning tunneling microscopy shows that the reactive hexayne segments of the molecules of six conjugated triple bonds are intact. The molecules agglomerate into ribbon-like islands, whose internal structure can be steered by the choice of the substituents. Our results suggest the use of ion beam deposition to arrange reactive precursors for subsequent polymerization reactions.

Original languageEnglish
Pages (from-to)228-234
Number of pages7
JournalInternational Journal of Mass Spectrometry
Volume377
Issue number1
DOIs
StatePublished - 2015
Externally publishedYes

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