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Situation Monitor: Diversity-Driven Zero-Shot Out-of-Distribution Detection using Budding Ensemble Architecture for Object Detection

  • Syed Sha Qutub
  • , Michael Paulitsch
  • , Kay Ulrich Scholl
  • , Neslihan Kose Cihangir
  • , Korbinian Hagn
  • , Fabian Oboril
  • , Gereon Hinz
  • , Alois Knoll
  • Intel Labs Europe
  • Technical University of Munich

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

We introduce Situation Monitor, a novel zero-shot Out-of-Distribution (OOD) detection approach for transformer-based object detection models to enhance reliability in safety-critical machine learning applications such as autonomous driving. The Situation Monitor utilizes the Diversity-based Budding Ensemble Architecture (DBEA) and increases the OOD performance by integrating a diversity loss into the training process on top of the budding ensemble architecture, detecting Far-OOD samples and minimizing false positives on Near-OOD samples. Moreover, utilizing the resulting DBEA increases the model's OOD performance and improves the calibration of confidence scores, particularly concerning the intersection over union of the detected objects. The DBEA model achieves these advancements with a 14% reduction in trainable parameters compared to the vanilla model. This signifies a substantial improvement in efficiency without compromising the model's ability to detect OOD instances and calibrate the confidence scores accurately.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
PublisherIEEE Computer Society
Pages3502-3511
Number of pages10
ISBN (Electronic)9798350365474
DOIs
StatePublished - 2024
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 - Seattle, United States
Duration: 16 Jun 202422 Jun 2024

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
Country/TerritoryUnited States
CitySeattle
Period16/06/2422/06/24

Keywords

  • BEA
  • OOD
  • Object detection
  • Out-of-distribution
  • Transformers
  • situation monitor

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