Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources

A. Hipp; J. Herzen; J. U. Hammel; P. Lytaev; A. Schreyer; F. Beckmann

doi:10.1117/12.2237582

Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources

A. Hipp
, J. Herzen
, J. U. Hammel
, P. Lytaev
, A. Schreyer
, F. Beckmann

Associate Professorship of Physics in Biomedical Imaging

Helmholtz-Zentrum Hereon outstation at Heinz Maier-Leibnitz Zentrum (MLZ)
European Spallation Source (ESS)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

Synchrotron X-ray imaging is constantly achieving higher spatial resolution. In the field of grating-based phase-contrast imaging, these developments allow to directly resolve the interference patterns created by a phase grating without need for a analyzer grating. In this study we analyzed the performance of a single-grating interferometer and compared it to a conventional double-grating interferometer. Based on simulations and measurements of a test phantom we evaluated the sensitivity, resolution and signal to noise ratios of different setup configurations.

Original language	English
Title of host publication	Developments in X-Ray Tomography X
Editors	Ge Wang, Stuart R. Stock, Bert Muller
Publisher	SPIE
ISBN (Electronic)	9781510603257
DOIs	https://doi.org/10.1117/12.2237582
State	Published - 2016
Event	Developments in X-Ray Tomography X - San Diego, United States Duration: 29 Aug 2016 → 31 Aug 2016

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9967
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Developments in X-Ray Tomography X
Country/Territory	United States
City	San Diego
Period	29/08/16 → 31/08/16

Keywords

Grating Interferometer
Microtomography
Phase Contrast
Synchrotron Radiation
X-ray Imaging

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10.1117/12.2237582

Cite this

Hipp, A., Herzen, J., Hammel, J. U., Lytaev, P., Schreyer, A., & Beckmann, F. (2016). Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources. In G. Wang, S. R. Stock, & B. Muller (Eds.), Developments in X-Ray Tomography X Article 996718 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9967). SPIE. https://doi.org/10.1117/12.2237582

@inproceedings{d742db3e903e49f19c986998cbb4073b,

title = "Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources",

abstract = "Synchrotron X-ray imaging is constantly achieving higher spatial resolution. In the field of grating-based phase-contrast imaging, these developments allow to directly resolve the interference patterns created by a phase grating without need for a analyzer grating. In this study we analyzed the performance of a single-grating interferometer and compared it to a conventional double-grating interferometer. Based on simulations and measurements of a test phantom we evaluated the sensitivity, resolution and signal to noise ratios of different setup configurations.",

keywords = "Grating Interferometer, Microtomography, Phase Contrast, Synchrotron Radiation, X-ray Imaging",

author = "A. Hipp and J. Herzen and Hammel, \{J. U.\} and P. Lytaev and A. Schreyer and F. Beckmann",

year = "2016",

doi = "10.1117/12.2237582",

language = "English",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Ge Wang and Stock, \{Stuart R.\} and Bert Muller",

booktitle = "Developments in X-Ray Tomography X",

}

Hipp, A, Herzen, J, Hammel, JU, Lytaev, P, Schreyer, A & Beckmann, F 2016, Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources. in G Wang, SR Stock & B Muller (eds), Developments in X-Ray Tomography X., 996718, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9967, SPIE, Developments in X-Ray Tomography X, San Diego, United States, 29/08/16. https://doi.org/10.1117/12.2237582

Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources. / Hipp, A.; Herzen, J.; Hammel, J. U. et al.
Developments in X-Ray Tomography X. ed. / Ge Wang; Stuart R. Stock; Bert Muller. SPIE, 2016. 996718 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9967).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources

AU - Hipp, A.

AU - Herzen, J.

AU - Hammel, J. U.

AU - Lytaev, P.

AU - Schreyer, A.

AU - Beckmann, F.

PY - 2016

Y1 - 2016

N2 - Synchrotron X-ray imaging is constantly achieving higher spatial resolution. In the field of grating-based phase-contrast imaging, these developments allow to directly resolve the interference patterns created by a phase grating without need for a analyzer grating. In this study we analyzed the performance of a single-grating interferometer and compared it to a conventional double-grating interferometer. Based on simulations and measurements of a test phantom we evaluated the sensitivity, resolution and signal to noise ratios of different setup configurations.

AB - Synchrotron X-ray imaging is constantly achieving higher spatial resolution. In the field of grating-based phase-contrast imaging, these developments allow to directly resolve the interference patterns created by a phase grating without need for a analyzer grating. In this study we analyzed the performance of a single-grating interferometer and compared it to a conventional double-grating interferometer. Based on simulations and measurements of a test phantom we evaluated the sensitivity, resolution and signal to noise ratios of different setup configurations.

KW - Grating Interferometer

KW - Microtomography

KW - Phase Contrast

KW - Synchrotron Radiation

KW - X-ray Imaging

UR - https://www.scopus.com/pages/publications/85007042176

U2 - 10.1117/12.2237582

DO - 10.1117/12.2237582

M3 - Conference contribution

AN - SCOPUS:85007042176

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Developments in X-Ray Tomography X

A2 - Wang, Ge

A2 - Stock, Stuart R.

A2 - Muller, Bert

PB - SPIE

T2 - Developments in X-Ray Tomography X

Y2 - 29 August 2016 through 31 August 2016

ER -

Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources

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Keywords

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