Single-grating interferometer for high-resolution phase-contrast imaging at synchrotron radiation sources

A. Hipp, J. Herzen, J. U. Hammel, P. Lytaev, A. Schreyer, F. Beckmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

Synchrotron X-ray imaging is constantly achieving higher spatial resolution. In the field of grating-based phase-contrast imaging, these developments allow to directly resolve the interference patterns created by a phase grating without need for a analyzer grating. In this study we analyzed the performance of a single-grating interferometer and compared it to a conventional double-grating interferometer. Based on simulations and measurements of a test phantom we evaluated the sensitivity, resolution and signal to noise ratios of different setup configurations.

Original languageEnglish
Title of host publicationDevelopments in X-Ray Tomography X
EditorsGe Wang, Stuart R. Stock, Bert Muller
PublisherSPIE
ISBN (Electronic)9781510603257
DOIs
StatePublished - 2016
EventDevelopments in X-Ray Tomography X - San Diego, United States
Duration: 29 Aug 201631 Aug 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9967
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceDevelopments in X-Ray Tomography X
Country/TerritoryUnited States
CitySan Diego
Period29/08/1631/08/16

Keywords

  • Grating Interferometer
  • Microtomography
  • Phase Contrast
  • Synchrotron Radiation
  • X-ray Imaging

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