Simultaneous measurement of tunneling current and force as a function of position through a lipid film on a solid substrate

Martin Specht, Frank Ohnesorge, Wolfgang M. Heckl

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

We present a new method using a simultaneous AFM-STM setup to define the concept of distance as a tunneling tip first approaches and then penetrates an organic film on a solid surface. This provides a method to investigate the imaging of low intrinsic conductivity organic material with an STM. In a lipid film using small tip-to-sample voltages, on the order of 1 V, we find an upper thickness limit for tunneling of 30 Å. However using higher voltages, on the order of 6 V, we measure a current through a lipid thickness of several 100 Å.

Original languageEnglish
Pages (from-to)L653-L658
JournalSurface Science
Volume257
Issue number1-3
DOIs
StatePublished - 1 Nov 1991
Externally publishedYes

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