Simulating and evaluating small-angle X-ray scattering of micro-voids in polypropylene during mechanical deformation

Stefan Fischer, Tobias Diesner, Bernhard Rieger, Othmar Marti

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

Micro-voids that evolve during mechanical deformation in polypropylene have been characterized by small-angle X-ray scattering. Such voids can be modelled as randomly distributed cylinders which are oriented along the stretching direction, showing a log-normal size distribution. The model and simulation results are presented here. Advantages and disadvantages of the approach, the validity of the model, and important considerations for data evaluation are discussed. Data analysis of two-dimensional scattering images has been performed using a fully automated MATLAB routine by direct model fitting to scattering images.

Original languageEnglish
Pages (from-to)603-610
Number of pages8
JournalJournal of Applied Crystallography
Volume43
Issue number3
DOIs
StatePublished - 2010

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