Abstract
High quality SiGe strained layer superlattices can be achieved by low temperature molecular beam epitaxy. Strain distribution and Brillouin zone folding effects have a large influence on the band structure. Photoluminescence from strain-symmetrized Si6Ge4 superlattices shows the first evidence for the achievement of a quasi-direct fundamental energy gap. Raman spectroscopy is used as a versatile tool to characterize short-period SiGe superlattices.
| Original language | English |
|---|---|
| Pages (from-to) | 1-8 |
| Number of pages | 8 |
| Journal | Thin Solid Films |
| Volume | 183 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 30 Dec 1989 |
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