SIC-testability of sequential logic controllers

J. Provost, J. M. Roussel, J. M. Faure

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

SIC (Single Input Change) test sequences must be privileged for conformance test of logic controllers, to prevent from erroneous test results when the test-bench and the implementation under test are not synchronized. This paper proposes first a definition of the SIC-testable part of a sequential specification model, i.e. the part of the model that can be tested by using a sequence starting from the initial state and for which only one input can change at one at the same time. Then, an algorithm to determine the SIC-testable part is given; if this part is the whole specification, the specification model is declared totally SIC-testable. Once the SIC-testable part obtained, a SIC sequence for conformance test of an implementation of this part can be generated. These contributions are exemplified on an example.

Original languageEnglish
Title of host publicationProceedings - WODES 2010
Subtitle of host publication10th International Workshop on Discrete Event Systems
PublisherIFAC Secretariat
Pages193-198
Number of pages6
EditionPART 1
ISBN (Print)9783902661791
DOIs
StatePublished - 2010
Externally publishedYes

Publication series

NameIFAC Proceedings Volumes (IFAC-PapersOnline)
NumberPART 1
Volume10
ISSN (Print)1474-6670

Keywords

  • Conformance test
  • Logic systems
  • Model-based test
  • Test sequence generation
  • Testability criterion

Fingerprint

Dive into the research topics of 'SIC-testability of sequential logic controllers'. Together they form a unique fingerprint.

Cite this