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Sequential detection technique to measure the shape of short THz pulses in the presence of a large jitter in the trigger signal

  • J. N. Hovenier
  • , R. W. Van Es
  • , T. O. Klaassen
  • , W. T. Wenckebach
  • , F. Klappenberger
  • , M. Krätschmer
  • , S. Winnerl
  • , E. Schomburg
  • , G. M.H. Knippels
  • , A. F.G. Van Der Meer
  • Delft University of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

The possibilities and restrictions for the use of the simple experimental method - differential electronic gating (DEG) - developed to determine the shape of repetitive subnano-second THz pulses in the presence of a large jitter in the trigger signal are investigated. This method, a modification of the recently reported differential optical gating method, is based on subpicosecond electronic gating employing a high frequency sequential oscilloscope. As the ultimate test, the shape of 10 ps FWHM THz pulses from the free electron laser FELIX has been measured.

Original languageEnglish
Pages (from-to)99-104
Number of pages6
JournalIEE Proceedings: Optoelectronics
Volume149
Issue number3
DOIs
StatePublished - Jun 2002
Externally publishedYes

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