Abstract
The possibilities and restrictions for the use of the simple experimental method - differential electronic gating (DEG) - developed to determine the shape of repetitive subnano-second THz pulses in the presence of a large jitter in the trigger signal are investigated. This method, a modification of the recently reported differential optical gating method, is based on subpicosecond electronic gating employing a high frequency sequential oscilloscope. As the ultimate test, the shape of 10 ps FWHM THz pulses from the free electron laser FELIX has been measured.
| Original language | English |
|---|---|
| Pages (from-to) | 99-104 |
| Number of pages | 6 |
| Journal | IEE Proceedings: Optoelectronics |
| Volume | 149 |
| Issue number | 3 |
| DOIs | |
| State | Published - Jun 2002 |
| Externally published | Yes |
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