Sequential detection technique to measure the shape of short THz pulses in the presence of a large jitter in the trigger signal

J. N. Hovenier, R. W. Van Es, T. O. Klaassen, W. T. Wenckebach, F. Klappenberger, M. Krätschmer, S. Winnerl, E. Schomburg, G. M.H. Knippels, A. F.G. Van Der Meer

Research output: Contribution to journalArticlepeer-review

Abstract

The possibilities and restrictions for the use of the simple experimental method - differential electronic gating (DEG) - developed to determine the shape of repetitive subnano-second THz pulses in the presence of a large jitter in the trigger signal are investigated. This method, a modification of the recently reported differential optical gating method, is based on subpicosecond electronic gating employing a high frequency sequential oscilloscope. As the ultimate test, the shape of 10 ps FWHM THz pulses from the free electron laser FELIX has been measured.

Original languageEnglish
Pages (from-to)99-104
Number of pages6
JournalIEE Proceedings: Optoelectronics
Volume149
Issue number3
DOIs
StatePublished - Jun 2002
Externally publishedYes

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