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SEM Characterization of a Silicon Drift Detector for Electron Spectroscopy

  • Matteo Gugiatti
  • , Matteo Biassoni
  • , Stefano Pozzi
  • , Marco Carminati
  • , Pietro King
  • , Carlo Fiorini
  • , Maura Pavan
  • , Oliviero Cremonesi
  • , Peter Lechner
  • , Susanne Mertens
  • Politecnico di Milano
  • INFN Sezione di Milano
  • Universit̀ Degli Studi di Milano-Bicocca
  • Max-Planck-Institut für Physik
  • Max-Planck-Institut für Physik

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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