Abstract
A gradient of nanometer-sized, self-assembly gold clusters on top of a thin polymer film was investigated. A characteristic change in cluster height was detected using an advanced characterization method for gradient surfaces and thin films. An approach combining a thin-film characterization method with a micrometer-sized x-ray beam enhanced the spatial resolution used by two orders of magnitude. It was shown that this approach allows for a nondestructive and contact-free reconstruction of the three-dimensional structure and morphology of the nanocluster gradient layer.
Original language | English |
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Pages (from-to) | 1935-1937 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 82 |
Issue number | 12 |
DOIs | |
State | Published - 24 Mar 2003 |