Security, Reliability and Test Aspects of the RISC-V Ecosystem

Jaume Abella; Sergi Alcaide; Jens Anders; Francisco Bas; Steffen Becker; Elke De Mulder; Nourhan Elhamawy; Frank K. Gurkaynak; Helena Handschuh; Carles Hernandez; Mike Hutter; Leonidas Kosmidis; Ilia Polian; Matthias Sauer; Stefan Wagner; Francesco Regazzoni

doi:10.1109/ETS50041.2021.9465449

Security, Reliability and Test Aspects of the RISC-V Ecosystem

Jaume Abella, Sergi Alcaide, Jens Anders, Francisco Bas, Steffen Becker, Elke De Mulder, Nourhan Elhamawy, Frank K. Gurkaynak, Helena Handschuh, Carles Hernandez, Mike Hutter, Leonidas Kosmidis, Ilia Polian, Matthias Sauer, Stefan Wagner, Francesco Regazzoni

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

RISC-V has emerged as a viable solution on academia and industry. However, to use open source hardware for safety-critical applications, we need a deep understanding of the way in which well established mechanisms for testing and reliability could be integrated and deployed on the RISC-V ecosystem, and we need a clear knowledge on how such an ecosystem can be leveraged to improve security. This paper includes four contributions presenting the potential of RISC-V in security research, the way in which RISC-V can be hardened against power analysis attacks, how to implement, using RISC-V, software and hardware/software solutions for dual core lock step, and how to perform system-level testing in the RISC-V ecosystem.

Original language	English
Title of host publication	Proceedings - 2021 IEEE European Test Symposium, ETS 2021
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665418492
DOIs	https://doi.org/10.1109/ETS50041.2021.9465449
State	Published - 24 May 2021
Externally published	Yes
Event	26th IEEE European Test Symposium, ETS 2021 - Virtual, Bruges, Belgium Duration: 24 May 2021 → 28 May 2021

Publication series

Name	Proceedings of the European Test Workshop
Volume	2021-May
ISSN (Print)	1530-1877
ISSN (Electronic)	1558-1780

Conference

Conference	26th IEEE European Test Symposium, ETS 2021
Country/Territory	Belgium
City	Virtual, Bruges
Period	24/05/21 → 28/05/21

Keywords

Reliability
RISC-V
Security
Side Channel Attacks
Testing

Access to Document

10.1109/ETS50041.2021.9465449

Cite this

Abella, J., Alcaide, S., Anders, J., Bas, F., Becker, S., De Mulder, E., Elhamawy, N., Gurkaynak, F. K., Handschuh, H., Hernandez, C., Hutter, M., Kosmidis, L., Polian, I., Sauer, M., Wagner, S., & Regazzoni, F. (2021). Security, Reliability and Test Aspects of the RISC-V Ecosystem. In Proceedings - 2021 IEEE European Test Symposium, ETS 2021 Article 9465449 (Proceedings of the European Test Workshop; Vol. 2021-May). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ETS50041.2021.9465449

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title = "Security, Reliability and Test Aspects of the RISC-V Ecosystem",

abstract = "RISC-V has emerged as a viable solution on academia and industry. However, to use open source hardware for safety-critical applications, we need a deep understanding of the way in which well established mechanisms for testing and reliability could be integrated and deployed on the RISC-V ecosystem, and we need a clear knowledge on how such an ecosystem can be leveraged to improve security. This paper includes four contributions presenting the potential of RISC-V in security research, the way in which RISC-V can be hardened against power analysis attacks, how to implement, using RISC-V, software and hardware/software solutions for dual core lock step, and how to perform system-level testing in the RISC-V ecosystem.",

keywords = "Reliability, RISC-V, Security, Side Channel Attacks, Testing",

author = "Jaume Abella and Sergi Alcaide and Jens Anders and Francisco Bas and Steffen Becker and {De Mulder}, Elke and Nourhan Elhamawy and Gurkaynak, {Frank K.} and Helena Handschuh and Carles Hernandez and Mike Hutter and Leonidas Kosmidis and Ilia Polian and Matthias Sauer and Stefan Wagner and Francesco Regazzoni",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 26th IEEE European Test Symposium, ETS 2021 ; Conference date: 24-05-2021 Through 28-05-2021",

year = "2021",

month = may,

day = "24",

doi = "10.1109/ETS50041.2021.9465449",

language = "English",

series = "Proceedings of the European Test Workshop",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Abella, J, Alcaide, S, Anders, J, Bas, F, Becker, S, De Mulder, E, Elhamawy, N, Gurkaynak, FK, Handschuh, H, Hernandez, C, Hutter, M, Kosmidis, L, Polian, I, Sauer, M, Wagner, S & Regazzoni, F 2021, Security, Reliability and Test Aspects of the RISC-V Ecosystem. in Proceedings - 2021 IEEE European Test Symposium, ETS 2021., 9465449, Proceedings of the European Test Workshop, vol. 2021-May, Institute of Electrical and Electronics Engineers Inc., 26th IEEE European Test Symposium, ETS 2021, Virtual, Bruges, Belgium, 24/05/21. https://doi.org/10.1109/ETS50041.2021.9465449

Security, Reliability and Test Aspects of the RISC-V Ecosystem. / Abella, Jaume; Alcaide, Sergi; Anders, Jens et al.
Proceedings - 2021 IEEE European Test Symposium, ETS 2021. Institute of Electrical and Electronics Engineers Inc., 2021. 9465449 (Proceedings of the European Test Workshop; Vol. 2021-May).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Security, Reliability and Test Aspects of the RISC-V Ecosystem

AU - Abella, Jaume

AU - Alcaide, Sergi

AU - Anders, Jens

AU - Bas, Francisco

AU - Becker, Steffen

AU - De Mulder, Elke

AU - Elhamawy, Nourhan

AU - Gurkaynak, Frank K.

AU - Handschuh, Helena

AU - Hernandez, Carles

AU - Hutter, Mike

AU - Kosmidis, Leonidas

AU - Polian, Ilia

AU - Sauer, Matthias

AU - Wagner, Stefan

AU - Regazzoni, Francesco

PY - 2021/5/24

Y1 - 2021/5/24

N2 - RISC-V has emerged as a viable solution on academia and industry. However, to use open source hardware for safety-critical applications, we need a deep understanding of the way in which well established mechanisms for testing and reliability could be integrated and deployed on the RISC-V ecosystem, and we need a clear knowledge on how such an ecosystem can be leveraged to improve security. This paper includes four contributions presenting the potential of RISC-V in security research, the way in which RISC-V can be hardened against power analysis attacks, how to implement, using RISC-V, software and hardware/software solutions for dual core lock step, and how to perform system-level testing in the RISC-V ecosystem.

AB - RISC-V has emerged as a viable solution on academia and industry. However, to use open source hardware for safety-critical applications, we need a deep understanding of the way in which well established mechanisms for testing and reliability could be integrated and deployed on the RISC-V ecosystem, and we need a clear knowledge on how such an ecosystem can be leveraged to improve security. This paper includes four contributions presenting the potential of RISC-V in security research, the way in which RISC-V can be hardened against power analysis attacks, how to implement, using RISC-V, software and hardware/software solutions for dual core lock step, and how to perform system-level testing in the RISC-V ecosystem.

KW - Reliability

KW - RISC-V

KW - Security

KW - Side Channel Attacks

KW - Testing

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M3 - Conference contribution

AN - SCOPUS:85113710465

T3 - Proceedings of the European Test Workshop

BT - Proceedings - 2021 IEEE European Test Symposium, ETS 2021

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 26th IEEE European Test Symposium, ETS 2021

Y2 - 24 May 2021 through 28 May 2021

ER -

Security, Reliability and Test Aspects of the RISC-V Ecosystem

Abstract

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Keywords

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