Abstract
The surface termination of hydrogenated diamond surfaces with lateral resolution of ∼ 10 nm was controlled using atomic force microscopy (AFM). Microscopic patterns can be scribed into a diamond surface, up to a depth of 3 nm using negatively biased silicon cantilevers. Electron affinity and conductivity were exhibited to the rest of the surface by the inscribed patterns. The effect of noncontact and contact AFM on pattern appearance was also discussed.
Original language | English |
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Pages (from-to) | 3336-3338 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 82 |
Issue number | 19 |
DOIs | |
State | Published - 12 May 2003 |