Scanning transmission X-ray microscopy with a fast framing pixel detector

A. Menzel, C. M. Kewish, P. Kraft, B. Henrich, K. Jefimovs, J. Vila-Comamala, C. David, M. Dierolf, P. Thibault, F. Pfeiffer, O. Bunk

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

Scanning transmission X-ray microscopy (STXM) is a powerful imaging technique, in which a small X-ray probe is raster scanned across a specimen. Complete knowledge of the complex-valued transmission function of the specimen can be gained using detection schemes whose every-day use, however, is often hindered by the need of specialized configured detectors or by slow or noisy readout of area detectors. We report on sub-50. nm-resolution STXM studies in the hard X-ray regime using the PILATUS, a fully pixelated fast framing detector operated in single-photon counting mode. We demonstrate a range of imaging modes, including phase contrast and dark-field imaging.

Original languageEnglish
Pages (from-to)1143-1147
Number of pages5
JournalUltramicroscopy
Volume110
Issue number9
DOIs
StatePublished - Aug 2010

Keywords

  • Phase contrast
  • Scanning transmission X-ray microscopy
  • X-ray microscopy

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