Scanning photoelectron microscopy of a bimetal/Si interface: Au coadsorbed on Ag/Si(111)

S. Günther, A. Kolmakov, J. Kovac, L. Casalis, L. Gregoratti, M. Marsi, M. Kiskinova

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The interaction of a (√ 3 × √3)R30°-Ag/Si(111) interface, containing Ag agglomerates, with Au coadsorbed at 300 K has been studied by means of scanning photoelectron microscopy and low-energy electron diffraction. The high lateral resolution provided by the microscope allowed detailed examination of the local composition and reactivity of the coexisting surface phases. A substantial difference in the evolution of the ordered two-dimensional (2D) and three-dimensional (3D) phases has been observed with increasing Au coverage. The spatially resolved Ag 3d, Si 2p and Au 4f core-level spectra taken from the √3-Ag phase and 3D agglomerates are used for investigation of the local compositional changes after Au deposition. The results revealed the complexity of the formation processes involved and showed the differences in the local reactivity of the two phases.

Original languageEnglish
Pages (from-to)145-149
Number of pages5
JournalSurface Science
StatePublished - 20 Apr 1997
Externally publishedYes


  • Gold
  • Metal-semiconductor interfaces
  • Photoemission
  • Silicon
  • Silver
  • Soft x-ray photoelectron spectroscopy
  • Surface structure, morphology, roughness, and topography


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