TY - GEN
T1 - Safety Metrics for Semantic Segmentation in Autonomous Driving
AU - Cheng, Chih Hong
AU - Knoll, Alois
AU - Liao, Hsuan Cheng
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021/8
Y1 - 2021/8
N2 - Within the context of autonomous driving, safety-related metrics for deep neural networks have been widely studied for image classification and object detection. In this paper, we further consider safety-Aware correctness and robustness metrics specialized for semantic segmentation. The novelty of our proposal is to move beyond pixel-level metrics: Given two images with each having $n$ pixels being class-flipped, the designed metrics should, depending on the clustering of pixels being class-flipped or the location of occurrence, reflect different levels of safety criticality. The result evaluated on an autonomous driving dataset demonstrates the validity and practicality of our proposed methodology.
AB - Within the context of autonomous driving, safety-related metrics for deep neural networks have been widely studied for image classification and object detection. In this paper, we further consider safety-Aware correctness and robustness metrics specialized for semantic segmentation. The novelty of our proposal is to move beyond pixel-level metrics: Given two images with each having $n$ pixels being class-flipped, the designed metrics should, depending on the clustering of pixels being class-flipped or the location of occurrence, reflect different levels of safety criticality. The result evaluated on an autonomous driving dataset demonstrates the validity and practicality of our proposed methodology.
UR - http://www.scopus.com/inward/record.url?scp=85118802300&partnerID=8YFLogxK
U2 - 10.1109/AITEST52744.2021.00021
DO - 10.1109/AITEST52744.2021.00021
M3 - Conference contribution
AN - SCOPUS:85118802300
T3 - Proceedings - 3rd IEEE International Conference on Artificial Intelligence Testing, AITest 2021
SP - 57
EP - 64
BT - Proceedings - 3rd IEEE International Conference on Artificial Intelligence Testing, AITest 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 3rd IEEE International Conference on Artificial Intelligence Testing, AITest 2021
Y2 - 23 August 2021 through 26 August 2021
ER -