Roughness correlations in ultra-thin polymer blend films

J. S. Gutmann; P. Müller-Buschbaum; D. W. Schubert; N. Stribeck; D. Smilgies; M. Stamm

doi:10.1016/S0921-4526(99)01888-8

Roughness correlations in ultra-thin polymer blend films

J. S. Gutmann
, P. Müller-Buschbaum
, D. W. Schubert
, N. Stribeck
, D. Smilgies
, M. Stamm

Chair of Functional Materials

MPI für Polymerforschung
Helmholtz-Zentrum Hereon outstation at Heinz Maier-Leibnitz Zentrum (MLZ)
Universität Hamburg
European Synchrotron Radiation Facility

Research output: Contribution to journal › Conference article › peer-review

21 Scopus citations

Abstract

Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr_0.91S/PBr_0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.

Original language	English
Pages (from-to)	40-44
Number of pages	5
Journal	Physica B: Condensed Matter
Volume	283
Issue number	1-3
DOIs	https://doi.org/10.1016/S0921-4526(99)01888-8
State	Published - Jun 2000
Event	6th International Conference on Surface X-ray and Neutron Scattering (SXNS-6) - Noordwijkerhout, Neth Duration: 12 Sep 1999 → 17 Sep 1999

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10.1016/S0921-4526(99)01888-8

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title = "Roughness correlations in ultra-thin polymer blend films",

abstract = "Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr0.91S/PBr0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.",

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T1 - Roughness correlations in ultra-thin polymer blend films

AU - Gutmann, J. S.

AU - Müller-Buschbaum, P.

AU - Schubert, D. W.

AU - Stribeck, N.

AU - Smilgies, D.

AU - Stamm, M.

PY - 2000/6

Y1 - 2000/6

N2 - Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr0.91S/PBr0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.

AB - Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr0.91S/PBr0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.

UR - https://www.scopus.com/pages/publications/0343826151

U2 - 10.1016/S0921-4526(99)01888-8

DO - 10.1016/S0921-4526(99)01888-8

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AN - SCOPUS:0343826151

SN - 0921-4526

VL - 283

SP - 40

EP - 44

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 1-3

T2 - 6th International Conference on Surface X-ray and Neutron Scattering (SXNS-6)

Y2 - 12 September 1999 through 17 September 1999

ER -

Roughness correlations in ultra-thin polymer blend films

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