TY - JOUR
T1 - Roughness correlations in ultra-thin polymer blend films
AU - Gutmann, J. S.
AU - Müller-Buschbaum, P.
AU - Schubert, D. W.
AU - Stribeck, N.
AU - Smilgies, D.
AU - Stamm, M.
PY - 2000/6
Y1 - 2000/6
N2 - Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr0.91S/PBr0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.
AB - Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr0.91S/PBr0.67S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.
UR - http://www.scopus.com/inward/record.url?scp=0343826151&partnerID=8YFLogxK
U2 - 10.1016/S0921-4526(99)01888-8
DO - 10.1016/S0921-4526(99)01888-8
M3 - Conference article
AN - SCOPUS:0343826151
SN - 0921-4526
VL - 283
SP - 40
EP - 44
JO - Physica B: Condensed Matter
JF - Physica B: Condensed Matter
IS - 1-3
T2 - 6th International Conference on Surface X-ray and Neutron Scattering (SXNS-6)
Y2 - 12 September 1999 through 17 September 1999
ER -