Rigorous modeling of parasitic effects in complex SAW RF filters

G. Fischerauer, D. Gogl, R. Weigel, P. Russer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

This work presents an easy-to-implement and fast lumped-element circuit model for the parasitics of complex low-loss surface acoustic wave (SAW) devices such as interdigitated interdigital transducer (IIDT) and image impedance connected (IIC) filters. The model parameters can be derived from a knowledge of the device geometry without recourse to optimization methods. We investigated the influence of the measurement setup, the package and the layout itself. It is shown how the model parameters are determined by either experiment or analysis. The greatly enhanced predictive power of the extended simulation model is demonstrated by applying it to a 15-transducer IIDT filter and a 22-transducer IIC filter at 900 MHz. It was found, for instance, that parasitic capacitances strongly influence the input impedance in the passband while the stopband level is easily explained by the inductive coupling between bond wires.

Original languageEnglish
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherPubl by IEEE
Pages1209-1212
Number of pages4
ISBN (Print)0780317793
StatePublished - 1994
Externally publishedYes
EventProceedings of the IEEE MTT-S International Microwave Symposium - San Diego, CA, USA
Duration: 23 May 199427 May 1994

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
Volume2
ISSN (Print)0149-645X

Conference

ConferenceProceedings of the IEEE MTT-S International Microwave Symposium
CitySan Diego, CA, USA
Period23/05/9427/05/94

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