TY - JOUR
T1 - Retiming of Synchronous Circuits with Variable Topology
AU - Simon, Sven
AU - Bucher, Ralf
AU - Nossek, Josef A.
N1 - Publisher Copyright:
© 1995 IEEE Computer Society. All rights reserved.
PY - 1995
Y1 - 1995
N2 - Generally, circuit design leads to a trade-off scenario between speed and various parameters lake power dissapalion, AT complexity, re-use of already existing cells, design time, etc. To deal with this trade-off, the interaction between retiming and the selection of combinational elements from a set of cells with these different parameters is considered here. Additionally, modifications of the circuat graph concerning the interconnections, e.g. due to associativity of the underlying algorithm, lead to a parameterized topology. The algorithm presented in this paper combines all three, retiming, the selection of specijiic cells and the choice of an appropriate topology an one optimization step.
AB - Generally, circuit design leads to a trade-off scenario between speed and various parameters lake power dissapalion, AT complexity, re-use of already existing cells, design time, etc. To deal with this trade-off, the interaction between retiming and the selection of combinational elements from a set of cells with these different parameters is considered here. Additionally, modifications of the circuat graph concerning the interconnections, e.g. due to associativity of the underlying algorithm, lead to a parameterized topology. The algorithm presented in this paper combines all three, retiming, the selection of specijiic cells and the choice of an appropriate topology an one optimization step.
UR - http://www.scopus.com/inward/record.url?scp=85184854826&partnerID=8YFLogxK
U2 - 10.1109/ICVD.1995.512091
DO - 10.1109/ICVD.1995.512091
M3 - Conference article
AN - SCOPUS:85184854826
SN - 1063-9667
SP - 130
EP - 134
JO - Proceedings of the IEEE International Conference on VLSI Design
JF - Proceedings of the IEEE International Conference on VLSI Design
T2 - Proceedings of the 8th International Conference on VLSI Design
Y2 - 4 January 1995 through 7 January 1995
ER -