Residual solvent content in conducting polymer-blend films mapped with scanning transmission x-ray microscopy

Robert Meier, Markus Schindler, Peter Müller-Buschbaum, Benjamin Watts

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

Near-edge x-ray absorption fine-structure spectra prove the presence of solvent molecules in conducting polymer films and are used to calculate the absolute solvent uptake of, e.g., 5 vol.% in poly(vinylcarbazole) (PVK) films, which were prepared by solution casting with cyclohexanone as solvent. Nanoscale scanning transmission x-ray microscopy (STXM) reveals a thickness-independent solvent content in a PVK gradient sample due to the formation of an enrichment layer of residual solvent. In polymer-blend films of PVK and poly(3-hexylthiophene) (P3HT), STXM probes a lateral residual solvent uptake, which depends on the composition of the phase-separation domains. For all measurements, oxygen-containing solvent molecules in oxygen-free conducting polymer films are used as marker material, and a significant amount of residual solvent is found in all types of investigated samples.

Original languageEnglish
Article number174205
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume84
Issue number17
DOIs
StatePublished - 10 Nov 2011

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