TY - GEN
T1 - Reliable CPS Design for Mitigating Semiconductor and Battery Aging in Electric Vehicles
AU - Chang, Wanli
AU - Proebstl, Alma
AU - Goswami, Dip
AU - Zamani, Majid
AU - Chakraborty, Samarjit
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/9/18
Y1 - 2015/9/18
N2 - Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.
AB - Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.
KW - Semiconductor aging
KW - battery aging
KW - cyber-physical systems
KW - quality of control
UR - http://www.scopus.com/inward/record.url?scp=84964969283&partnerID=8YFLogxK
U2 - 10.1109/CPSNA.2015.16
DO - 10.1109/CPSNA.2015.16
M3 - Conference contribution
AN - SCOPUS:84964969283
T3 - Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015
SP - 37
EP - 42
BT - Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015
Y2 - 19 August 2015 through 21 August 2015
ER -