Reflectron time-of-flight mass spectrometry and laser excitation for the analysis of neutrals, ionized molecules and secondary fragments

Reflection time-of-flight mass spectrometry in combination with laser ionization is described in this review. Firstly, options for laser ionization are presented. Then, sources of time-of-flight uncertainties are discussed with special emphasis on the spatial focus of an ion source and on reflection techniques for correction of these time-of-flight uncertainties. Furthermore, the behaviour of spontaneous and induced delayed ion decay in a reflection spectrometer is discussed. Knowledge of this behaviour has been used to develop scanning techniques for laser tandem mass spectrometry. Additional applications of laser reflectron mass spectrometry discussed in this review are the measurement of ion decay times, mass spectrometry combined with laser desorption from surfaces and the laser mass spectrometry of isomers.