TY - GEN
T1 - Reduction of CMOS power consumption and signal integrity issues by routing optimization
AU - Zuber, Paul
AU - Windschiegl, Armin
AU - De Otálora, Raúl Medina Beltrán
AU - Stechele, Walter
AU - Herkersdorf, Andreas
PY - 2005
Y1 - 2005
N2 - This paper suggests a methodology to decrease the power of a static CMOS standard cell design at layout level by focusing on switched capacitance. The term switched is the key: if a capacitance is not switched often, it may be high. If it is frequently switched, it should be minimized in order to reduce power consumption. This can be done by an algorithm based on forces that automatically optimizes the position and length of every single wire segment in a routed design. The forces are proportional to the toggle activities derived from a gate level simulation. The novelty is that this allows to iteratively find a new topology for the wire segments. Our algorithm takes as input an already given, grid routed layout.
AB - This paper suggests a methodology to decrease the power of a static CMOS standard cell design at layout level by focusing on switched capacitance. The term switched is the key: if a capacitance is not switched often, it may be high. If it is frequently switched, it should be minimized in order to reduce power consumption. This can be done by an algorithm based on forces that automatically optimizes the position and length of every single wire segment in a routed design. The forces are proportional to the toggle activities derived from a gate level simulation. The novelty is that this allows to iteratively find a new topology for the wire segments. Our algorithm takes as input an already given, grid routed layout.
UR - http://www.scopus.com/inward/record.url?scp=33646907114&partnerID=8YFLogxK
U2 - 10.1109/DATE.2005.256
DO - 10.1109/DATE.2005.256
M3 - Conference contribution
AN - SCOPUS:33646907114
SN - 0769522882
SN - 9780769522883
T3 - Proceedings -Design, Automation and Test in Europe, DATE '05
SP - 986
EP - 987
BT - Proceedings - Design, Automation and Test in Europe, DATE '05
T2 - Design, Automation and Test in Europe, DATE '05
Y2 - 7 March 2005 through 11 March 2005
ER -