Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators

Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Automotive Microcontrollers (MCUs) are extensively tested to guarantee zero-defect quality. Performance screening is one of the critical factors to ensure that MCUs meet quality requirements. Ring Oscillator (RO) structures are used for this performance screening. Such RO structures usually cause routing overhead on the chip. The routing overhead increases, especially when many ROs are implemented. This paper presents a novel self-enabling technique that significantly reduces the routing overhead for functional path ROs. We present a proof of concept on a large automotive MCU. The routing overhead can be reduced by over 80% compared to traditional approaches.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE European Test Symposium, ETS 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665467063
DOIs
StatePublished - 2022
Event27th IEEE European Test Symposium, ETS 2022 - Barcelona, Spain
Duration: 23 May 202227 May 2022

Publication series

NameProceedings of the European Test Workshop
Volume2022-May
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780

Conference

Conference27th IEEE European Test Symposium, ETS 2022
Country/TerritorySpain
CityBarcelona
Period23/05/2227/05/22

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