Abstract
The effects of proton and deuteron implantation on the Raman spectra of CdF2 crystals have been investigated. It is found that Raman scattering can provide a quantitative measure for the structural damage caused by the implantation procedure. These results also elucidate the intrinsic or extrinsic origin of Raman peaks observed in semiconducting CdF2.
| Original language | English |
|---|---|
| Pages (from-to) | 3922-3924 |
| Number of pages | 3 |
| Journal | Journal of Applied Physics |
| Volume | 62 |
| Issue number | 9 |
| DOIs | |
| State | Published - 1987 |
| Externally published | Yes |
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