Abstract
The effects of proton and deuteron implantation on the Raman spectra of CdF2 crystals have been investigated. It is found that Raman scattering can provide a quantitative measure for the structural damage caused by the implantation procedure. These results also elucidate the intrinsic or extrinsic origin of Raman peaks observed in semiconducting CdF2.
Original language | English |
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Pages (from-to) | 3922-3924 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 62 |
Issue number | 9 |
DOIs | |
State | Published - 1987 |
Externally published | Yes |