Abstract
We show that Raman scattering by coupled plasmon-LO phonons of n-GaAs can be used to study the wavevector- and frequency-dependent dielectric function of the charge carriers. It is found that Landau-damping is induced by finite temperatures and carrier lifetime effects. When Landau-damping effects are negligible the results are well described, to the lowest order in wavevector, by the random phase approximation.
| Original language | English |
|---|---|
| Pages (from-to) | 959-962 |
| Number of pages | 4 |
| Journal | Solid State Communications |
| Volume | 21 |
| Issue number | 10 |
| DOIs | |
| State | Published - Mar 1977 |
| Externally published | Yes |