Abstract
We show that Raman scattering by coupled plasmon-LO phonons of n-GaAs can be used to study the wavevector- and frequency-dependent dielectric function of the charge carriers. It is found that Landau-damping is induced by finite temperatures and carrier lifetime effects. When Landau-damping effects are negligible the results are well described, to the lowest order in wavevector, by the random phase approximation.
Original language | English |
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Pages (from-to) | 959-962 |
Number of pages | 4 |
Journal | Solid State Communications |
Volume | 21 |
Issue number | 10 |
DOIs | |
State | Published - Mar 1977 |
Externally published | Yes |