@inproceedings{dd1d40d77b68466c9036943ad1b8c8d8,
title = "Quasi-simultaneous external electrooptic probing of transverse and longitudinal field distributions taking into account the probe tip invasiveness",
abstract = "A versatile electrooptic measurement setup facilitates the direct probing of circuits on electrooptic substrates and on arbitrary substrates by employing an external probe tip of a specific crystal-cut that allows the quasi-simultaneous probing of transverse and quasi-longitudinal electric field components. Employing the presented quasi-simultaneous measurements and the theoretical methods, the determined change in intensity of the transmitted laser beam can be used for the implementation of correction algorithms in the space-domain and time-domain. As examples we use microstrip lines and coupled microstrip transmission lines.",
author = "W. Thomann and P. Russer",
year = "1994",
language = "English",
isbn = "0780317793",
series = "IEEE MTT-S International Microwave Symposium Digest",
publisher = "Publ by IEEE",
pages = "1601--1604",
booktitle = "IEEE MTT-S International Microwave Symposium Digest",
note = "Proceedings of the IEEE MTT-S International Microwave Symposium ; Conference date: 23-05-1994 Through 27-05-1994",
}