Quantized conductance in a Si/Si0.7Ge0.3 split-gate device and impurity-related magnetotransport phenomena

D. Többen, D. A. Wharam, G. Abstreiter, J. P. Kotthaus, F. Schäffler

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Abstract

We have defined a quantum point-contact by the split-gate technique in a Si/SiGe heterostructure containing a two-dimensional electron gas with an elastic mean free path of about 1.3 μm. The conductance of this device shows typical steps very close to multiples of 4e2 h-1. Upon application of a perpendicular magnetic field the spin and valley degeneracies are lifted and magnetic depopulation of the one-dimensional subbands can be observed. The appearance of Aharonov-Bohm oscillations for B ≥ 2 T and of resonant tunneling peaks close to "pinch-off" indicates the presence of impurities close to the constriction.

Original languageEnglish
Pages (from-to)405-408
Number of pages4
JournalSolid-State Electronics
Volume40
Issue number1-8
DOIs
StatePublished - 1996

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