Abstract
In industrial crystallization processes, attrition based secondary nucleation together with crystal growth are often the dominating factors with respect to process stability and product quality. In this contribution a method to estimate attrition rates using Focussed Beam Reflectance Measurement (FBRM) technology is presented. The experimental effort of the method is very low compared to other methods and only the standard equipment shipped with the FBRM probe is needed. The method is based on separating attrition effects from growth, dissolution and aggregation by using a non-solvent. Due to the brevity of this paper the focus is on the methodology. Experimental results are therefore restricted to the system of pentaerythritol crystals suspended in acetone.
| Original language | English |
|---|---|
| Article number | B-7 |
| Pages (from-to) | 319-324 |
| Number of pages | 6 |
| Journal | VDI Berichte |
| Issue number | 1901 I |
| State | Published - 2005 |
| Externally published | Yes |