Quantitative measurement of attrition based secondary nucleation using a Lasentec D600 FBRM device

Norbert Kail, Heiko Briesen, Wolfgang Marquardt

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

In industrial crystallization processes, attrition based secondary nucleation together with crystal growth are often the dominating factors with respect to process stability and product quality. In this contribution a method to estimate attrition rates using Focussed Beam Reflectance Measurement (FBRM) technology is presented. The experimental effort of the method is very low compared to other methods and only the standard equipment shipped with the FBRM probe is needed. The method is based on separating attrition effects from growth, dissolution and aggregation by using a non-solvent. Due to the brevity of this paper the focus is on the methodology. Experimental results are therefore restricted to the system of pentaerythritol crystals suspended in acetone.

Original languageEnglish
Article numberB-7
Pages (from-to)319-324
Number of pages6
JournalVDI Berichte
Issue number1901 I
StatePublished - 2005
Externally publishedYes

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