Abstract
Here we report on a non-destructive, spatially resolving and easy to implement quality and parameter control method for high aspect ratio X-ray absorption gratings. Based on angular X-ray transmission measurements, our proposed technique allows to determine the duty cycle, the transmittance, the height, as well as the local inclination of the absorbing grating structures. A key advantage of the presented method is a fast and extensive grating quality evaluation without the need of implementing an entire grating interferometer. In addition to the local and surface-based analysis using a scanning electron microscope, our non-destructive method provides global averaged macroscopic and spatially resolved grating structure information without the requirement of resolving individual grating lines.
| Original language | English |
|---|---|
| Pages (from-to) | 15943-15955 |
| Number of pages | 13 |
| Journal | Optics Express |
| Volume | 27 |
| Issue number | 11 |
| DOIs | |
| State | Published - 2019 |
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