TY - GEN
T1 - Pushing the Boundaries of AI Chips
T2 - 2025 Design, Automation and Test in Europe Conference, DATE 2025
AU - Benkhelifa, Mahdi
AU - Parihar, Shivendra S.
AU - Kar, Anirban
AU - Pahwa, Girish
AU - Chauhan, Yogesh S.
AU - Amrouch, Hussam
N1 - Publisher Copyright:
© 2025 EDAA.
PY - 2025
Y1 - 2025
N2 - As CMOS scaling approaches its fundamental limits, the explosive rise of AI and LLMs has unveiled profound bottlenecks in computing architectures. This paper presents two groundbreaking paradigms poised to reshape the landscape of high-performance computing and meet the surging demands of AI-driven workloads. The first paradigm is 3D monolithic integration, a revolutionary approach that achieves unprecedented logic density through Complementary FETs (CFETs), where pMOS and nMOS transistors are vertically stacked, and a dramatic expansion of on-chip memory capacity by integrating memory layers atop logic transistors. The second paradigm leverages the transformative potential of operating chips at cryogenic temperatures where transistors exhibit enhanced performance, and parasitic resistances are substantially minimized. These advancements hold the promise of redefining computing efficiency and performance for the AI era.
AB - As CMOS scaling approaches its fundamental limits, the explosive rise of AI and LLMs has unveiled profound bottlenecks in computing architectures. This paper presents two groundbreaking paradigms poised to reshape the landscape of high-performance computing and meet the surging demands of AI-driven workloads. The first paradigm is 3D monolithic integration, a revolutionary approach that achieves unprecedented logic density through Complementary FETs (CFETs), where pMOS and nMOS transistors are vertically stacked, and a dramatic expansion of on-chip memory capacity by integrating memory layers atop logic transistors. The second paradigm leverages the transformative potential of operating chips at cryogenic temperatures where transistors exhibit enhanced performance, and parasitic resistances are substantially minimized. These advancements hold the promise of redefining computing efficiency and performance for the AI era.
KW - 3D integration
KW - AI acceleration
KW - Cryogenic
UR - https://www.scopus.com/pages/publications/105006891214
U2 - 10.23919/DATE64628.2025.10992872
DO - 10.23919/DATE64628.2025.10992872
M3 - Conference contribution
AN - SCOPUS:105006891214
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - 2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 31 March 2025 through 2 April 2025
ER -