TY - GEN
T1 - Pull-in curves determined with monolithic FEM models
AU - Hannot, Stephan D.A.
AU - Rixen, Daniel J.
PY - 2009
Y1 - 2009
N2 - This paper gives an overview of the different monolithic approaches to compute the pull-in curve for discretized models of electrostatically actuated microsystems that are currently available in the literature. A method to implement monolithic charge loading combined with path-following is proposed. The performance of the algorithms is tested with some numerical experiments: FEM models of microbeams, used to model micro-switches. The resultsshow that the charge loading scheme provides a fast converging alternative to the traditional path-following approaches. Finally it is shown that the algorithm can be easily extended to handle bifurcations.
AB - This paper gives an overview of the different monolithic approaches to compute the pull-in curve for discretized models of electrostatically actuated microsystems that are currently available in the literature. A method to implement monolithic charge loading combined with path-following is proposed. The performance of the algorithms is tested with some numerical experiments: FEM models of microbeams, used to model micro-switches. The resultsshow that the charge loading scheme provides a fast converging alternative to the traditional path-following approaches. Finally it is shown that the algorithm can be easily extended to handle bifurcations.
UR - http://www.scopus.com/inward/record.url?scp=67650563482&partnerID=8YFLogxK
U2 - 10.1109/ESIME.2009.4938406
DO - 10.1109/ESIME.2009.4938406
M3 - Conference contribution
AN - SCOPUS:67650563482
SN - 9781424441617
T3 - 2009 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2009
BT - 2009 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2009
T2 - 2009 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2009
Y2 - 26 April 2009 through 29 April 2009
ER -