TY - GEN
T1 - Protecting FPGA-based automotive systems against soft errors through reduced precision redundancy
AU - Stechele, Walter
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/8/10
Y1 - 2015/8/10
N2 - Due to their beneficial performance/power/cost ratio, hybrid systems of CPU and FPGA devices are gaining interest from automotive domain. However, FPGA devices suffer from their soft error susceptibility in safety-critical applications. Traditional protection mechanisms like Triple Module Redundancy are well known from space applications, but seem too costly for automotive. In this paper, we introduce first ideas on extending the well-known reduced precision redundancy methods from Shanbhag towards protecting FPGA devices against soft errors by adding CPU-based redundancy. The cost of protection is estimated for a fuel injection control unit with respect to chip area and CPU time overhead, as compared to conventional TMR-based protection.
AB - Due to their beneficial performance/power/cost ratio, hybrid systems of CPU and FPGA devices are gaining interest from automotive domain. However, FPGA devices suffer from their soft error susceptibility in safety-critical applications. Traditional protection mechanisms like Triple Module Redundancy are well known from space applications, but seem too costly for automotive. In this paper, we introduce first ideas on extending the well-known reduced precision redundancy methods from Shanbhag towards protecting FPGA devices against soft errors by adding CPU-based redundancy. The cost of protection is estimated for a fuel injection control unit with respect to chip area and CPU time overhead, as compared to conventional TMR-based protection.
KW - FPGA
KW - automotive
KW - reduced precision redundancy
KW - safety
KW - soft error
UR - http://www.scopus.com/inward/record.url?scp=84959571412&partnerID=8YFLogxK
U2 - 10.1109/SIES.2015.7185057
DO - 10.1109/SIES.2015.7185057
M3 - Conference contribution
AN - SCOPUS:84959571412
T3 - 2015 10th IEEE International Symposium on Industrial Embedded Systems, SIES 2015 - Proceedings
SP - 170
EP - 173
BT - 2015 10th IEEE International Symposium on Industrial Embedded Systems, SIES 2015 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 10th IEEE International Symposium on Industrial Embedded Systems, SIES 2015
Y2 - 8 June 2015 through 10 June 2015
ER -