Keyphrases
SiOx
100%
Absorption Bands
100%
Hydrogenated Amorphous Silicon
100%
Annealing
100%
Room-temperature Photoluminescence
100%
Silicon Suboxide
100%
High Temperature
50%
X Ray Diffraction
50%
Porous Silicon
50%
Room Temperature
50%
Spectral Shape
50%
Nanocrystals
50%
Hydrogenated
50%
Visible Photoluminescence
50%
Infrared Spectra
50%
Annealing Conditions
50%
Infrared Absorption
50%
Raman Scattering
50%
Triplet Excitons
50%
DC Magnetron Sputtering
50%
Optically Detected Magnetic Resonance
50%
Hydrogen-deuterium Exchange
50%
Photoluminescence Intensity
50%
Luminescence Intensity
50%
SiOx Film
50%
Visible Luminescence
50%
Silicon Oxide Film
50%
Substoichiometric
50%
Physics
Room Temperature
100%
Photoluminescence
100%
Amorphous Silicon
100%
Absorption Spectra
66%
Exciton
33%
Magnetic Resonance
33%
Raman Spectra
33%
X Ray Diffraction
33%
Deuterium
33%
Infrared Absorption
33%
Magnetron Sputtering
33%
Silicon Oxide
33%
Porous Silicon
33%
Infrared Radiation
33%
Oxide Film
33%
Material Science
Amorphous Silicon
100%
Photoluminescence
100%
Film
66%
Luminescence
66%
Absorption Spectra
66%
Silicon
33%
X-Ray Diffraction
33%
Magnetron Sputtering
33%
Oxide Film
33%
Deuterium
33%
Porous Silicon
33%