Processor-in-the Loop Test and Experimental Validations for developed Nine level PV Inverter using High Performance ARM-STM32F407

Bouazza Fekkak, Abdelhamid Loukriz, Ralph Kennel, Hakim Azoug, Abdellah Kouzou, Mohamed Abdelrahem, Mostefa Mohamed-Seghir, Hocine Belmili, Mohamed Menaa

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper a Single-Phase nine level inverter based on conventional single-phase H-bridge topology is proposed. It is dedicated to be used for ensuring the connection of single AC load to photovoltaic system. The proposed inverter system features less of switches number and a new auxiliary switches conception. Hence, it gives better voltage regulation, smooth operation and efficient yield compared to multi-level inverters. The proposed inverter topology is capable of producing nine levels of output voltage levels. This inverter is firstly simulated under MATLAB/Simulink software, thereafter, co-simulated using the Processor-in-the-loop (PIL) technique. Secondly, the proposed inverter is designed and tested experimentally. The inverter control is implemented on the high-speed ARM-STM32F407 board. Based on the obtained results, it can be seen clearly that co-simulation results are matching experimental results, which proves the validity of the proposed multi-level inverter. This topology can be extended for more number of phases and levels.

Original languageEnglish
Title of host publication2021 IEEE Southern Power Electronics Conference, SPEC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665436236
DOIs
StatePublished - 2021
Event2021 IEEE Southern Power Electronics Conference, SPEC 2021 - Kigali, Rwanda
Duration: 6 Dec 20219 Dec 2021

Publication series

Name2021 IEEE Southern Power Electronics Conference, SPEC 2021

Conference

Conference2021 IEEE Southern Power Electronics Conference, SPEC 2021
Country/TerritoryRwanda
CityKigali
Period6/12/219/12/21

Keywords

  • Multi-level inverter
  • PIL testing
  • Semiconductor power devices
  • THD. STM32F407 Board

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