Probe pattern inaccuracy in fully probe corrected multilevel plane wave based near-field far-field transformed planar near-field measurements

M. Ayyaz Qureshi, Carsten H. Schmidt, Thomas F. Eibert

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The uncertainty in the transformed far field of an antenna under test due to probe pattern inaccuracy is investigated for multilevel plane wave based near-field far-field transformation algorithm. A random error based on signal-to-noise ratio of the probe far field magnitude is introduced in the probe pattern which is then used for full probe correction. To avoid the effect of other environmental and measurement errors, synthetic approach utilizing electric dipoles to synthesize an antenna under test is used. The deterioration in the transformed far field gets significant as the inaccuracy in the probe pattern is increased, thus providing a rough limit on the probe pattern inaccuracy for the required accuracy in the far field. The error behavior is then compared with standard transformation technique employing 2D Fast Fourier Transform.

Original languageEnglish
Title of host publication2012 IEEE International Symposiumon Antennas and Propagation, APSURSI 2012 - Proceedings
DOIs
StatePublished - 2012
EventJoint 2012 IEEE International Symposium on Antennas and Propagation and USNC-URSI National Radio Science Meeting, APSURSI 2012 - Chicago, IL, United States
Duration: 8 Jul 201214 Jul 2012

Publication series

NameIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
ISSN (Print)1522-3965

Conference

ConferenceJoint 2012 IEEE International Symposium on Antennas and Propagation and USNC-URSI National Radio Science Meeting, APSURSI 2012
Country/TerritoryUnited States
CityChicago, IL
Period8/07/1214/07/12

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