Preparation and characterization of YBCO thin films on silicon

J. Tate, P. Berberich, W. Dietsche, H. Kinder

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

We have prepared thin films of superconducting YBa2Cu3O7 on bare silicon (100) by thermal co-evaporation of yttrium, barium and copper in an oxygen atmosphere. The temperature never exceeds the deposition temperature of about 650°C. No post-deposition annealing is necessary to achieve superconductivity at 85 K and critical current densities, at 4.2 K, of 9 × 104 A cm-2. X-Ray diffraction studies show that the best films are oriented with the c axis perpendicular to the substrate, with no trace of reflections other than those from (00l) planes. We have also produced c axis oriented superconducting YBCO films on silicon substrates with buffer layers of amorphous SiO2 and amorphous Si3N4. The best superconducting characteristics of these films were transition temperatures of 68-69 K and critical current densities at 4.2 K of 3 × 103 A cm-2.

Original languageEnglish
Pages (from-to)311-316
Number of pages6
JournalJournal of The Less-Common Metals
Volume151
Issue numberC
DOIs
StatePublished - 15 May 1989

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