@inproceedings{0b3b2a6787774cb089b7546880dab88e,
title = "Predictive physical model of cosmic-radiation-induced failures of power devices",
abstract = "In the last ten years, the hardening of silicon high power devices against cosmic-radiation-induced failure gained decisive importance. A systematic improvement of the robustness against cosmic radiation requires a fundamental physical understanding of the microscopic mechanisms which lead to the failure or even destruction of power devices. We performed detailed 3D thermo-electrical device simulations to study the local self-heating in the device in order to explain the failure and destruction mechanisms and compared the results with experimental data obtained from nucleon irradiation experiments. Several diode designs with varying doping concentration and vertical size of the device were investigated.",
keywords = "cosmic radiation, electro-thermal device simulation, silicon power devices",
author = "C. Weiss and G. Wachutka and A. Hartl and F. Hille and F. Pfirsch",
year = "2012",
doi = "10.1109/EPEPEMC.2012.6397423",
language = "English",
isbn = "9781467319713",
series = "15th International Power Electronics and Motion Control Conference and Exposition, EPE-PEMC 2012 ECCE Europe",
pages = "LS2e.31--LS2e.35",
booktitle = "15th International Power Electronics and Motion Control Conference and Exposition, EPE-PEMC 2012 ECCE Europe",
note = "15th International Power Electronics and Motion Control Conference and Exposition, EPE-PEMC 2012 ECCE Europe ; Conference date: 04-09-2012 Through 06-09-2012",
}