@inproceedings{d1f98ab35a644ee3b830d57939c54cc0,
title = "Predicting future product performance: Modeling and evaluation of standard cells in FinFET technologies",
abstract = "With continued scaling of CMOS technology it becomes increasingly difficult to maintain reliable circuits. Early predictive technology and design exploration help to understand major effects of variability sources and their impact on circuit performances. With each new technology basic circuit blocks have to be redesigned to appropriately evaluate the impact of technology scaling. Therefore, this paper presents an approach which is able to find the optimal sizing of basic circuit blocks considering process variation. We utilize this approach to predict the impact of scaling in FinFET technologies and the influence of process variations in future technology nodes.",
keywords = "Discrete sizing, Finfet, NBTI, Predictive modeling, Process variations, Standard cells",
author = "Kleeberger, {Veit B.} and Helmut Graeb and Ulf Schlichtmann",
year = "2013",
doi = "10.1145/2463209.2488775",
language = "English",
isbn = "9781450320719",
series = "Proceedings - Design Automation Conference",
booktitle = "Proceedings of the 50th Annual Design Automation Conference, DAC 2013",
note = "50th Annual Design Automation Conference, DAC 2013 ; Conference date: 29-05-2013 Through 07-06-2013",
}