Abstract
In this Letter we demonstrate a method for real-time determination of the carrier-envelope phase of each and every single ultrashort laser pulse at kilohertz repetition rates. The technique expands upon the recent work of Wittmann and incorporates a stereographic above-threshold laser-induced ionization measurement and electronics optimized to produce a signal corresponding to the carrier-envelope phase within microseconds of the laser interaction, thereby facilitating data-tagging and feedback applications. We achieve a precision of 113 mrad (6:5°) over the entire 2π range.
Original language | English |
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Pages (from-to) | 1-3 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 36 |
Issue number | 1 |
DOIs | |
State | Published - 1 Jan 2011 |
Externally published | Yes |