@inproceedings{0e38f9b5889e4621adc7914b9a373b25,
title = "Precise laser fault injections into 90 nm and 45 nm SRAM-cells",
abstract = "In the area of fault attacks, lasers are a common method to inject faults into an integrated circuit. Against the background of decreasing structure sizes in ICs, it is of interest which fault model can be met with state of the art equipment. We investigate laser-based fault injections into the SRAM-cells of block RAMs of two different FPGAs with 90nm and 45 nm feature size respectively. Our results show that individual bit manipulations are feasible for both, the 90nm chip and the 45 nm chip, but with limitations for the latter. To the best of our knowledge, we are the first to investigate laser fault injections into 45nm technology nodes. We provide detailed insights of our laser equipment and the parameters of our setup to give a comparison base for further research.",
keywords = "Comparing 45 nm and 90nm, High-precision, Laser-based fault injection, SRAM",
author = "Bodo Selmke and Stefan Brummer and Johann Heyszl and Georg Sigl",
note = "Publisher Copyright: {\textcopyright} Springer International Publishing Switzerland 2016.; 14th International Conference on Smart Card Research and Advanced Application, CARDIS 2015 ; Conference date: 04-11-2015 Through 06-11-2015",
year = "2016",
doi = "10.1007/978-3-319-31271-2\_12",
language = "English",
isbn = "9783319312705",
series = "Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)",
publisher = "Springer Verlag",
pages = "193--205",
editor = "Naofumi Homma and Marcel Medwed",
booktitle = "Smart Card Research and Advanced Applications - 14th International Conference, CARDIS 2015, Revised Selected Papers",
}