Precise control of Jeff= 12 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness

Stephan Geprags; Björn Erik Skovdal; Monika Scheufele; Matthias Opel; Didier Wermeille; Paul Thompson; Alessandro Bombardi; Virginie Simonet; Stéphane Grenier; Pascal Lejay; Gilbert Andre Chahine; Diana Lucia Quintero-Castro; Rudolf Gross; Danny Mannix

doi:10.1103/PhysRevB.102.214402

Precise control of Jeff= 12 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness

Stephan Geprags, Björn Erik Skovdal, Monika Scheufele, Matthias Opel, Didier Wermeille, Paul Thompson, Alessandro Bombardi, Virginie Simonet, Stéphane Grenier, Pascal Lejay, Gilbert Andre Chahine, Diana Lucia Quintero-Castro, Rudolf Gross, Danny Mannix

Chair of Technical Physics

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6 Scopus citations

Abstract

We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff=1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.

Original language	English
Article number	214402
Journal	Physical Review B
Volume	102
Issue number	21
DOIs	https://doi.org/10.1103/PhysRevB.102.214402
State	Published - 2 Dec 2020

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Geprags, S., Skovdal, B. E., Scheufele, M., Opel, M., Wermeille, D., Thompson, P., Bombardi, A., Simonet, V., Grenier, S., Lejay, P., Chahine, G. A., Quintero-Castro, D. L., Gross, R., & Mannix, D. (2020). Precise control of Jeff= 12 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness. Physical Review B, 102(21), Article 214402. https://doi.org/10.1103/PhysRevB.102.214402

@article{9665c2574fee4015bad1ff5ba03d5f31,

title = "Precise control of Jeff= 12 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness",

abstract = "We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff=1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.",

author = "Stephan Geprags and Skovdal, {Bj{\"o}rn Erik} and Monika Scheufele and Matthias Opel and Didier Wermeille and Paul Thompson and Alessandro Bombardi and Virginie Simonet and St{\'e}phane Grenier and Pascal Lejay and Chahine, {Gilbert Andre} and Quintero-Castro, {Diana Lucia} and Rudolf Gross and Danny Mannix",

note = "Publisher Copyright: {\textcopyright} 2020 American Physical Society.",

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doi = "10.1103/PhysRevB.102.214402",

language = "English",

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Geprags, S, Skovdal, BE, Scheufele, M, Opel, M, Wermeille, D, Thompson, P, Bombardi, A, Simonet, V, Grenier, S, Lejay, P, Chahine, GA, Quintero-Castro, DL, Gross, R & Mannix, D 2020, 'Precise control of Jeff= 12 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness', Physical Review B, vol. 102, no. 21, 214402. https://doi.org/10.1103/PhysRevB.102.214402

TY - JOUR

T1 - Precise control of Jeff= 12 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness

AU - Geprags, Stephan

AU - Skovdal, Björn Erik

AU - Scheufele, Monika

AU - Opel, Matthias

AU - Wermeille, Didier

AU - Thompson, Paul

AU - Bombardi, Alessandro

AU - Simonet, Virginie

AU - Grenier, Stéphane

AU - Lejay, Pascal

AU - Chahine, Gilbert Andre

AU - Quintero-Castro, Diana Lucia

AU - Gross, Rudolf

AU - Mannix, Danny

PY - 2020/12/2

Y1 - 2020/12/2

N2 - We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff=1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.

AB - We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff=1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.

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JO - Physical Review B

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Precise control of Jeff= 12 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness

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