Precise control of Jeff= 12 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness

Stephan Geprags, Björn Erik Skovdal, Monika Scheufele, Matthias Opel, Didier Wermeille, Paul Thompson, Alessandro Bombardi, Virginie Simonet, Stéphane Grenier, Pascal Lejay, Gilbert Andre Chahine, Diana Lucia Quintero-Castro, Rudolf Gross, Danny Mannix

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff=1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.

Original languageEnglish
Article number214402
JournalPhysical Review B
Volume102
Issue number21
DOIs
StatePublished - 2 Dec 2020
Externally publishedYes

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