Physical origin of data pattern inversion in optical injection-locked VCSELs

Weijian Yang, Peng Guo, Devang Parekh, Werner Hofmann, Markus C. Amann, Connie J. Chang-Hasnain

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The physical origin and criteria for adjustable data pattern inversion in optical injection locked VCSELs are explained with a novel model including the interference effect of master laser reflection. Simulation results agree well with experiments.

Original languageEnglish
Title of host publicationFrontiers in Optics, FiO 2009
PublisherOptical Society of America (OSA)
ISBN (Print)9781557528780
DOIs
StatePublished - 2009
EventFrontiers in Optics, FiO 2009 - San Jose, CA, United States
Duration: 11 Oct 200915 Oct 2009

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceFrontiers in Optics, FiO 2009
Country/TerritoryUnited States
CitySan Jose, CA
Period11/10/0915/10/09

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